The Sensitive High Resolution Ion Micro Probe (SHRIMP) IIe is a high precision Secondary Ion Mass Spectrometer (SIMS). Ion microprobes make in situ isotopic and chemical 'surface' analysis of solid targets by bombarding the sample with an ion beam with a diameter of several microns typically employing Kohler focussing. The high mass resolution of SHRIMP IIe is achieved by the use of double-focussing mass spectrometer (simultaneous energy and mass refocussing) with a very large turning radius of Magnet and Electrostatic Analyser. SHRIMP has many applications: zircon dating in copper-uranium-gold-silver deposits, uranium-lead dating of sulphur in the sulphide minerals that form metal ores, the isotopic composition of sulphur in the giant base metal ore bodies.

With the addition of an optional cesium gun rather than the standard duoplasmatron, the SHRIMP IIe excels in the analysis of oxygen and other stable isotopes. Analysis of non-conductive samples is assisted with the optional electron gun for charge neutralisation.

The SHRIMP V is the next commercial version of the SHRIMP SI ion microprobe built at the ANU by Professor Trevor Ireland, for both positive mode geochronology and negative mode stable isotope analysis.